FPGA Realization of Fault Diagnostic and Fault Tolerant Scheme for Digital Circuits

Authors(2) :-John Kalloor, B. Baskaran

The paper echoes to formulate a sequence for injecting, detecting and healing the random occurrence of stuck at faults in combinational circuits. The philosophy involves the immaculate use of an LFSR to generate interconnect fault patterns in the passage of primary inputs of the circuit on their way to the destination. The theory extends to enjoy the benefits of a checker circuit to identify and ensure the presence of faults in an attempt to transcend the corrective action. It engages the artefacts of digital logic principles to evolve a fault tolerant status for the methodology and facilitates to arrive at the fault free output in the presence of faults. The exercise augurs to annihilate the common types of stuck at faults to enhance the reliability in the use of such circuits. The Modelsim platform espouses to pronounce the reality in realizing the nuances of the design in the procedure and avail the artefacts of an FPGA to demonstrate its practical significance.

Authors and Affiliations

John Kalloor
Department of Electrical and Electronics Engineering, Annamalai University, Chidambaram, Tamil Nadu, India
B. Baskaran
Department of Electrical and Electronics Engineering, Annamalai University, Chidambaram, Tamil Nadu, India

Fault Injection, Fault Tolerance, FPGA, LFSR, Stuck at faults, VHDL

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Publication Details

Published in : Volume 3 | Issue 1 | January-February 2018
Date of Publication : 2018-02-28
License:  This work is licensed under a Creative Commons Attribution 4.0 International License.
Page(s) : 165-172
Manuscript Number : CSEIT183149
Publisher : Technoscience Academy

ISSN : 2456-3307

Cite This Article :

John Kalloor, B. Baskaran, "FPGA Realization of Fault Diagnostic and Fault Tolerant Scheme for Digital Circuits", International Journal of Scientific Research in Computer Science, Engineering and Information Technology (IJSRCSEIT), ISSN : 2456-3307, Volume 3, Issue 1, pp.165-172, January-February-2018.
Journal URL : http://ijsrcseit.com/CSEIT183149

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