DR. SHESHANG DEGADWALA; DHRUMIL DAVE. Progresses in Sugarcane Leaf Defect Identification : A Review . International Journal of Scientific Research in Computer Science, Engineering and Information Technology, [S. l.], v. 10, n. 5, p. 01–11, 2024. DOI: 10.32628/CSEIT2410581. Disponível em: http://ijsrcseit.com/index.php/home/article/view/CSEIT2410581.. Acesso em: 27 sep. 2024.