Multi-Class Recognition of Soybean Leaf Diseases using a Conv-LSTM Model

Shivani Shelke Shelke; Dr. Sheshang Degadwala Degadwala

doi:10.32628/CSEIT2410217

Authors

Shivani Shelke Research Scholar, Department of Computer Engineering, Sigma Institute of Engineering, Gujarat, India Author
Dr. Sheshang Degadwala Professor & Head of Department, Department of Computer Engineering, Sigma University, Gujarat, India Author

DOI:

https://doi.org/10.32628/CSEIT2410217

Keywords:

Soybean Leaf Disease, CNN-LSTM, AlexNet, VggNet, ResNet

Abstract

This research presents an innovative approach for multi-class recognition of soybean leaf diseases using a Convolutional Long Short-Term Memory (Conv-LSTM) model. The model integrates the spatial learning capabilities of convolutional layers with the temporal dependencies of LSTM units, addressing the critical need for accurate disease detection in agriculture, particularly in soybean cultivation where leaf diseases significantly impact crop yield and quality. Through comparative experiments with established deep learning models such as AlexNet, VGG16, and ResNet50, the Conv-LSTM model demonstrates superior performance in terms of accuracy, precision, recall, and F1 score. By effectively capturing both spatial and temporal features in soybean leaf images, the Conv-LSTM model showcases its potential to enhance disease detection accuracy, supporting precision agriculture practices and enabling timely interventions to mitigate crop losses caused by diseases.

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