SHARVANI MUKKALA. Advanced Low Power Verification Methodologies: A Comprehensive Framework for Modern Semiconductor Design. International Journal of Scientific Research in Computer Science, Engineering and Information Technology, [S. l.], v. 11, n. 1, p. 1431–1439, 2025. DOI: 10.32628/CSEIT251112137. Disponível em: https://ijsrcseit.com/index.php/home/article/view/CSEIT251112137. Acesso em: 31 jul. 2025.