LURDUMA REDDY THIRUMALA REDDY. An Overview and Criticality of High Availability and Disaster Recovery for SAP HANA. International Journal of Scientific Research in Computer Science, Engineering and Information Technology, [S. l.], v. 11, n. 1, p. 1618–1626, 2025. DOI: 10.32628/CSEIT251112189. Disponível em: https://ijsrcseit.com/index.php/home/article/view/CSEIT251112189. Acesso em: 30 jul. 2025.